Abstract: Detailed temperature field distribution of high-power insulated gate bipolar transistor (IGBT) modules is essential information for reliability analysis and thermal design of power ...

Abstract: Fault diagnosis is essential for enhancing the reliability of voltage source inverter (VSI) systems. This article proposes a rapid, noncontact method for detecting open-circuit faults (OCFs) ...

By bridging the gap between theoretical logic and practical application, the syllabus fosters the technical proficiency and ...