Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Researchers have evaluated how Vision Transformers and convolutional neural networks can support faster and more accurate ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Within the context of semiconductor inspection and failure analysis, latent defects present a significant challenge because they make it difficult to determine whether a fault originated during ...

Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Maintaining high product quality while keeping up with production speed is more important than ever for manufacturers. This ...