Board-level and semiconductor test data are often analyzed separately, limiting correlation across the product lifecycle. Linking PCB assembly (PCBA) test results, including in-circuit and functional ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Multi-die assemblies greatly increase the number of things that can go wrong, and the difficulty of finding them.

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

The official launch ceremony of TWSC Guangming Intelligent Manufacturing Base was successfully held at Guangming Science City ...