MONROVIA, Calif.--(BUSINESS WIRE)--SiLC Technologies, Inc. (SiLC), the leading developer of integrated single-chip FMCW LiDAR solutions, today announced the launch of Eyeonic ® Trace, its ...

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Konstanz, Germany -- Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable ...